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Skip to Search Results- 2Achal, Roshan
- 2Anagaw, Amsalu Y.
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- 2Avendano Nandez, Jose L
- 2Chen, Ke
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- 14Particles (Nuclear physics)
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Results for "departments_tesim:"Department of Physics""
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Atomic Force Microscopy Characterization of Hydrogen Terminated Silicon (100) 2x1 Reconstruction
DownloadFall 2015
Non-contact Atomic Force Microscopy (NC-AFM) is a Scanning Probe Microscopy tool offering unique non-perturbative analysis of surfaces and adsorbates at the atomic scale. AFM precisely oscillates a sharp tip above a sample. By monitoring the shift in resonance frequency of a quartz tuning fork...
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Spring 2021
The development of the modern transistor has sparked a technological revolution which has flourished for the past 70 years. Advancements in transistor design and fabrication have allowed for their continued shrinking in size and increase in operation speed. With the continued reduction in size...
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Fall 2019
Velocity analysis can be a time-consuming task when it is performed manually. Methods have been proposed to automate the process of velocity analysis, which, however, typically requires significant manual effort. We propose using the Convolutional Neural Network (CNN) to estimate stacking...
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Spring 2011
The generation and evolution of internal solitary waves by intrusive gravity currents and river plumes are examined in an axisymmetric geometry by way of theory, experiments and numerical simulations. Full depth lock-release experiments and simulations demonstrate that vertically symmetric...