We will be performing routine ERA maintenance starting 3PM Tuesday Feb 19 until 3PM Wednesday Feb 20. ERA searches and downloads will perform as usual, but the "Deposit" and "Edit" function will be suspended during the maintenance period. When the work is complete, we'll remove this notice. Thanks for your understanding!
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Non-contact Atomic Force Microscopy (NC-AFM) is a Scanning Probe Microscopy tool offering unique non-perturbative analysis of surfaces and adsorbates at the atomic scale. AFM precisely oscillates a sharp tip above a sample. By monitoring the shift in resonance frequency of a quartz tuning fork...