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- 1Achal, Roshan
- 1Chung, Deborah K
- 1Epp, Eric
- 1Huff,Taleana R
- 1JavadiCharani, Morteza
- 1Kohandehghan, Alireza
Aquatic organisms are susceptible to waterborne nanoparticles and there is only limited understanding of the mechanisms by which these emerging contaminants affect biological processes. The unique properties of nanomaterials necessitate evaluation of standard toxicity testing techniques to...
Non-contact Atomic Force Microscopy (NC-AFM) is a Scanning Probe Microscopy tool offering unique non-perturbative analysis of surfaces and adsorbates at the atomic scale. AFM precisely oscillates a sharp tip above a sample. By monitoring the shift in resonance frequency of a quartz tuning fork...
On a perfect hydrogen-terminated Si(100)-2x1 surface, each surface silicon atom is capped with exactly one atom of hydrogen. When one of the capping hydrogen atoms is removed, the now unsatisfied orbital of the underlying silicon atom is exposed at that site. This site is better known as a...
This thesis explores the dynamics and sensing performance of silicon quantum dot (SiQD) ensembles coupled to the whispering gallery modes (WGMs) of spherical and cylindrical microcavities. The first project investigated the possibility of observing Purcell effects in an ensemble of QDs coupled to...
This thesis focuses on the photoluminescence (PL) of free-standing silicon quan- tum dots (QDs). Large changes in the emission spectrum were found to occur when the QDs were exposed to different environments while undergoing short-wavelength laser irradiation, a phenomenon that was the main focus...
This thesis describes the fabrication and characterization of integrated hollow Bragg waveguides fabricated by controlled thin film buckling. Hollow waveguides based on two different set of materials were studied. In the first case, thermal tuning of air-core dimensions was studied using...
Observing and Manipulating Single Electrons Confined to Silicon Dangling Bond Ensembles with Non-Contact Atomic Force MicroscopyDownload
Non-contact atomic force microscopy (nc-AFM) is capable of inducing and resolving single-electron charge transitions of surface adsorbates. Here, these techniques are extended by studying the charge configurations of dangling bond (DB) ensembles on the hydrogen-terminated silicon surface. nc-AFM...
We present the characterization of close-spaced linear dangling bond structures, or dangling bond chains, two to seven dangling bonds long, on a hydrogen terminated silicon (100)-2x1 surface using a scan- ning tunnelling microscope. Constant height differential conductance maps reveal their local...
Dangling Bonds (DBs) on the silicon surface exist when a silicon atom lacks a bonding partner, resulting in a localized orbital which is not involved in any chemical bonds. On the hydrogen-terminated Si(100) surface, such DBs introduce a mid-gap state. DBs can be created on this surface by the...
The field of plasmonics has offered the promise to combine electronics and photonics at the nanometer scale for ultrafast information processing speeds and compact integration of devices. Various plasmonic waveguide schemes were proposed with the potential to achieve switching functionalities and...