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Fall 2009
Extending electronic devices beyond the limitations of current micro-electronics manufacturing will require detailed knowledge of how to make contacts to semiconductor surfaces. In this work, we investigated several methods by which such connections to silicon surfaces could be achieved. Scanning...
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Fall 2012
In studies of nanoscale materials, electron tomography (ET) can be used to obtain three dimensional information on the morphology and spatial distribution of nanoparticles. Electron tomography records a tilt series of projected images of an object and then mathematically reconstructs a 3D map of...
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