Search
Skip to Search Results
Filter
Subject / Keyword
- 2FIM
- 1AFM
- 1Atomic force microscopy
- 1Constant height
- 1Dangling bonds
- 1Feedback-controlled lithography
Languages
Collections
Author / Creator / Contributor
Year
Item type
Departments
-
Atomic Force Microscopy Characterization of Hydrogen Terminated Silicon (100) 2x1 Reconstruction
DownloadFall 2015
Non-contact Atomic Force Microscopy (NC-AFM) is a Scanning Probe Microscopy tool offering unique non-perturbative analysis of surfaces and adsorbates at the atomic scale. AFM precisely oscillates a sharp tip above a sample. By monitoring the shift in resonance frequency of a quartz tuning fork...
-
Nanolithography on H:Si(100)-(2 x 1) using combined Scanning Tunneling Microscopy and Field Ion Microscopy techniques
DownloadFall 2011
This thesis reports on the combined techniques of ultra-high vacuum scanning tunneling microscopy (UHV-STM) and field ion microscopy (FIM). The apex structure of STM scanning tips correlates with their ability to yield highly-resolved images and to perform accurate hydrogen desorption on...
1 - 2 of 2