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Atomic Electronics With Silicon Dangling Bonds: Error Correction, Logical Gates, and Electrostatic Environment
DownloadSpring 2020
With the potential to unleash a new basis for electronics that are more energy efficient, faster, and at the ultimate scale in size density, single atoms as building blocks for miniature circuity have long been a technological holy grail. Preventing significant development have been various...
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Atomic Force Microscopy Characterization of Hydrogen Terminated Silicon (100) 2x1 Reconstruction
DownloadFall 2015
Non-contact Atomic Force Microscopy (NC-AFM) is a Scanning Probe Microscopy tool offering unique non-perturbative analysis of surfaces and adsorbates at the atomic scale. AFM precisely oscillates a sharp tip above a sample. By monitoring the shift in resonance frequency of a quartz tuning fork...
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