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Author: Huff,Taleana R
Subject: Atomic force microscopy
Subject: Constant height
Subject: FIM
Subject: Force spectroscopy
Subject: H:Si(100)
Languages: English
Collections: Graduate and Postdoctoral Studies (GPS), Faculty of
Collections: Graduate and Postdoctoral Studies (GPS), Faculty of/Theses and Dissertations
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Atomic Force Microscopy Characterization of Hydrogen Terminated Silicon (100) 2x1 Reconstruction
DownloadFall 2015
Non-contact Atomic Force Microscopy (NC-AFM) is a Scanning Probe Microscopy tool offering unique non-perturbative analysis of surfaces and adsorbates at the atomic scale. AFM precisely oscillates a sharp tip above a sample. By monitoring the shift in resonance frequency of a quartz tuning fork...
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