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Atomic Force Microscopy Characterization of Hydrogen Terminated Silicon (100) 2x1 Reconstruction
DownloadFall 2015
Non-contact Atomic Force Microscopy (NC-AFM) is a Scanning Probe Microscopy tool offering unique non-perturbative analysis of surfaces and adsorbates at the atomic scale. AFM precisely oscillates a sharp tip above a sample. By monitoring the shift in resonance frequency of a quartz tuning fork...
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Nano-scale studies of the assembly, structure and properties of hybrid organic-silicon systems
DownloadFall 2011
Advancements in the field of electronics might be achieved by future molecular scale devices. Hybrid organic-silicon structures have the potential to overcome many challenges facing the use of molecules as devices while maintaining the ability to interface with traditional silicon technology. The...
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