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Skip to Search Results- 1Drummond, Lindsay S.
- 1Huff,Taleana R
- 1Jones, C. Allyson
- 1Sinha, Shoma
- 1Slaughter, Susan E.
- 1Vesa, Cristian
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Affirming the value of the resident assessment instrument: Minimum data set version 2.0 for nursing home decision-making and quality improvement
Download2015
Wagg, Adrian S., Drummond, Lindsay S., Jones, C. Allyson, Slaughter, Susan E.
Background: We examined the agreement over time of the physical functioning domains of the Resident Assessment Instrument: Minimum Data Set Version 2.0 (RAI-MDS) and the Functional Independence Measure (FIM) in nursing home residents with dementia. Methods: We completed a secondary analysis of...
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Atomic Force Microscopy Characterization of Hydrogen Terminated Silicon (100) 2x1 Reconstruction
DownloadFall 2015
Non-contact Atomic Force Microscopy (NC-AFM) is a Scanning Probe Microscopy tool offering unique non-perturbative analysis of surfaces and adsorbates at the atomic scale. AFM precisely oscillates a sharp tip above a sample. By monitoring the shift in resonance frequency of a quartz tuning fork...
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Nano-scale studies of the assembly, structure and properties of hybrid organic-silicon systems
DownloadFall 2011
Advancements in the field of electronics might be achieved by future molecular scale devices. Hybrid organic-silicon structures have the potential to overcome many challenges facing the use of molecules as devices while maintaining the ability to interface with traditional silicon technology. The...
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Nanolithography on H:Si(100)-(2 x 1) using combined Scanning Tunneling Microscopy and Field Ion Microscopy techniques
DownloadFall 2011
This thesis reports on the combined techniques of ultra-high vacuum scanning tunneling microscopy (UHV-STM) and field ion microscopy (FIM). The apex structure of STM scanning tips correlates with their ability to yield highly-resolved images and to perform accurate hydrogen desorption on...