This decommissioned ERA site remains active temporarily to support our final migration steps to https://ualberta.scholaris.ca, ERA's new home. All new collections and items, including Spring 2025 theses, are at that site. For assistance, please contact erahelp@ualberta.ca.
Search
Skip to Search Results
Filter
Author / Creator / Contributor
Subject / Keyword
Year
Collections
Languages
Item type
-
Accelerated Verification of Integrated Circuits Against the Effects of Process, Voltage and Temperature Variations
DownloadSpring 2016
As Moore's Law continues to drive the advancement of new complementary metal-oxide semiconductor (CMOS) technology generations toward feature sizes in the sub 10 nm regime, the role of process, voltage and temperature (PVT) variations have become increasingly important when designing integrated...
1 - 1 of 1