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Skip to Search Results- 1CMP
- 1CeO2
- 1Ceria
- 1Chemical Mechanical Planarization
- 1Chemical Mechanical Polishing
- 1Colloidal Interaction
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Fall 2014
Interactions of finely dispersed abrasive particles in chemical mechanical planarization (CMP) slurries play a vital role in determining the polishing performance. In this study, coupled influence of hydrodynamic and colloidal interactions on the attachment of nanosized ceria (CeO2) particles to...
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Fall 2021
Growing demand for electrical energy calls for more efficient electronic devices not only in terms of performance but also in terms of energy-efficient fabrication processes. With traditional semiconductors (such as silicon) reaching their limits in electrical power handling, alternative...