ERA users may experience an intermittent Deposit/Save error. We apologize for any inconvenience this may cause. Thank you for your patience while we work to resolve the issue. When the work is completed, we'll remove this notice.
Search
Skip to Search Results
Filter
Item type
Author / Creator / Contributor
Year
Collections
Languages
-
Analysis of Evolutionary Optimization Algorithms in Automated Test Pattern Generation for Sequential Circuits
DownloadSpring 2017
In automated test pattern generation (ATPG), test patterns are automatically generated and tested against all specific modeled faults, such as stuck-at fault, which is most commonly used in fault modeling. Testing of sequential circuits can be performed exhaustively, randomly or algorithmically....
1 - 1 of 1