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Advanced Materials and Detection Methods in Ultrathin-Layer Chromatography

  • Author / Creator
    Oko, Anthony J
  • The performance of highly anisotropic, nanostructured, thin-film ultrathin-layer chromatography (UTLC) media with porosity and architecture engineered using the glancing-angle deposition (GLAD) process is investigated. Anisotropic structures resembling nanoblades are fabricated on the plates, producing channel-like features that partially decouple analyte migration from development direction, and offering new separation behaviours. These GLAD UTLC plates provide channel features that reduce transverse spot broadening while providing the wide pores required for rapid migration and high separation performance with plate numbers approaching 800. The rapid separations typical of these miniaturized plates call for new alternative detection techniques. I have designed, implemented and characterized a measurement system which records UTLC separations in full colour with 32 µm spatial resolution and 33 ms temporal resolution. My code analyzes multiple tracks per plate, filters analyte spots by colour, and automatically generates time-resolved figures of merit. Both absorption and transmission detection modes are examined, each of which offers their own advantages.

  • Subjects / Keywords
  • Graduation date
    2013-06
  • Type of Item
    Thesis
  • Degree
    Master of Science
  • DOI
    https://doi.org/10.7939/R3X054
  • License
    This thesis is made available by the University of Alberta Libraries with permission of the copyright owner solely for non-commercial purposes. This thesis, or any portion thereof, may not otherwise be copied or reproduced without the written consent of the copyright owner, except to the extent permitted by Canadian copyright law.
  • Language
    English
  • Institution
    University of Alberta
  • Degree level
    Master's
  • Department
    • Department of Electrical and Computer Engineering
  • Specialization
    • Microsystems and Nanodevices
  • Supervisor / co-supervisor and their department(s)
    • Brett, Michael (Electrical and Computer Engineering)
  • Examining committee members and their departments
    • Brett, Michael (Electrical and Computer Engineering)
    • Sit, Jeremy (Electrical and Computer Engineering)
    • Chen, Weixing (Chemical and Materials Engineering)