Some effects of systematic reflections on electron microscope images of stacking faults

• Author / Creator

  Botros, Kamal Zaki

• Subjects / Keywords

  • Dislocations in crystals.
  • Reflection electron microscopy.
  • Electron microscopy.

• Graduation date

  1973

• Type of Item

  Thesis

• Degree

  Doctor of Philosophy in Solid State Physics

• DOI

  https://doi.org/10.7939/r3-axyp-s239

• License

  This thesis is made available by the University of Alberta Libraries with permission of the copyright owner solely for the purpose of private, scholarly or scientific research. This thesis, or any portion thereof, may not otherwise be copied or reproduced without the written consent of the copyright owner, except to the extent permitted by Canadian copyright law.