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Exploring Application-level Fault Tolerance for Robust Design Using FPGA

  • Author / Creator
    Chen, Jing
  • Single Event Upset has become an increasingly important issue for SRAM-based Field Programmable Gate Arrays. To mitigate these soft errors, most of existing works focused on utilizing logic-level flexibilities to improve circuit reliability. However, we notice that from an application's perspective, there exist higher-level flexibilities. This kind of application-level fault tolerance can be useful from two aspects: one is by directly modifying algorithms (algorithm-based fault tolerance), and the other is by mapping algorithm properties into logic level (algorithm-mapping fault tolerance). In this thesis, we perform two case studies to analyze the impact of both categories of application-level fault tolerance on circuit reliability, and explore their linkages to the logic-level fault tolerance. With an enhanced algorithm considering algorithm-based fault tolerance, the error rate for the matrix multiplication can be reduced by 18x. Moreover, by mapping algorithm properties into logic level, we achieve 3x improvement in circuit reliability for the discrete convolution.

  • Subjects / Keywords
  • Graduation date
    2012-11
  • Type of Item
    Thesis
  • Degree
    Master of Science
  • DOI
    https://doi.org/10.7939/R3TP87
  • License
    This thesis is made available by the University of Alberta Libraries with permission of the copyright owner solely for non-commercial purposes. This thesis, or any portion thereof, may not otherwise be copied or reproduced without the written consent of the copyright owner, except to the extent permitted by Canadian copyright law.
  • Language
    English
  • Institution
    University of Alberta
  • Degree level
    Master's
  • Department
    • Department of Electrical and Computer Engineering
  • Specialization
    • Computer, Microelectronic Devices, Circuits and Systems
  • Supervisor / co-supervisor and their department(s)
    • Hu, Yu (Electrical and Computer Engineering)
  • Examining committee members and their departments
    • Hu, Yu (Electrical and Computer Engineering)
    • Lin, Guohui (Computing Science)
    • Han, Jie (Electrical and Computer Engineering)