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- 1Aqueous-solutions
- 1Auger-electron spectroscopy
- 1Dissolution rates
- 1Labradorite feldspar
- 1Oxygen isotope analysis
- 1Ph = 2
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1994
Abstract: Secondary ion mass spectrometry (SIMS) is the mass spectrometry of atomic species which are emitted when a solid surface is bombarded by an energetic primary ion beam. By continually bombarding the surface of the sample with the ion beam, the atoms making up the material being studied...
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