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- 1Dangling bonds
- 1FIM
- 1Feedback-controlled lithography
- 1H:Si(100)-(2 x 1)
- 1Hydrogen desorption
- 1Nanolithography
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Nanolithography on H:Si(100)-(2 x 1) using combined Scanning Tunneling Microscopy and Field Ion Microscopy techniques
DownloadFall 2011
This thesis reports on the combined techniques of ultra-high vacuum scanning tunneling microscopy (UHV-STM) and field ion microscopy (FIM). The apex structure of STM scanning tips correlates with their ability to yield highly-resolved images and to perform accurate hydrogen desorption on...
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