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Journal Articles (Electrical and Computer Engineering)
Items in this Collection
- 2Secondary Emission
- 1Backscattering
- 1Electric Fields
- 1Electric Measurements
- 1Electron Emission
- 1Microwaves
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Positive bias and vacuum chamber wall effect on total electron yield measurement: A re-consideration of the sample current method
Download2017-01-01
Ye, Ming, Wang, Dan, Li, Yun, He, Yong-ning, Cui, Wan-zhao, Daneshmand, Mojgan
The measurement of the total secondary electron yield (TEY, δ) is of fundamental importance in areas such as accelerator, spacecraft, detector, and plasma system. Most of the running TEY facilities in the world are based on the kind of bias strategy. The applied bias can assist in the collection...
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Study of multipactor suppression of microwave components using perforated waveguide technology for space applications
Download2017-01-01
Ye, Ming, Li, Yun, He, Yongning, Daneshmand, Mojgan
With the development of space technology, microwave components with increased power handling capability and reduced weight have been urgently required. In this work, the perforated waveguide technology is proposed to suppress the multipactor effect of high power microwavecomponents. Meanwhile,...