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Journal Articles (Electrical and Computer Engineering)
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Positive bias and vacuum chamber wall effect on total electron yield measurement: A re-consideration of the sample current method
Download2017-01-01
Ye, Ming, Wang, Dan, Li, Yun, He, Yong-ning, Cui, Wan-zhao, Daneshmand, Mojgan
The measurement of the total secondary electron yield (TEY, δ) is of fundamental importance in areas such as accelerator, spacecraft, detector, and plasma system. Most of the running TEY facilities in the world are based on the kind of bias strategy. The applied bias can assist in the collection...
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